Yu, Honggang, Wang, Shuo, Shan, Haoqi, Panoff, Maximillian, Lee, Michael, Yang, Kaichen, and Jin, Yier. Dual-Leak: Deep Unsupervised Active Learning for Cross-Device Profiled Side-Channel Leakage Analysis. Retrieved from https://par.nsf.gov/biblio/10462670. 2023 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) . Web. doi:10.1109/HOST55118.2023.10133491.

Yu, Honggang, Wang, Shuo, Shan, Haoqi, Panoff, Maximillian, Lee, Michael, Yang, Kaichen, & Jin, Yier. Dual-Leak: Deep Unsupervised Active Learning for Cross-Device Profiled Side-Channel Leakage Analysis. 2023 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), (). Retrieved from https://par.nsf.gov/biblio/10462670. https://doi.org/10.1109/HOST55118.2023.10133491

Yu, Honggang, Wang, Shuo, Shan, Haoqi, Panoff, Maximillian, Lee, Michael, Yang, Kaichen, and Jin, Yier. "Dual-Leak: Deep Unsupervised Active Learning for Cross-Device Profiled Side-Channel Leakage Analysis". 2023 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) (). Country unknown/Code not available. https://doi.org/10.1109/HOST55118.2023.10133491. https://par.nsf.gov/biblio/10462670.

@article{osti_10462670,
place = {Country unknown/Code not available}, title = {Dual-Leak: Deep Unsupervised Active Learning for Cross-Device Profiled Side-Channel Leakage Analysis}, url = {https://par.nsf.gov/biblio/10462670}, DOI = {10.1109/HOST55118.2023.10133491}, abstractNote = {}, journal = {2023 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)}, author = {Yu, Honggang and Wang, Shuo and Shan, Haoqi and Panoff, Maximillian and Lee, Michael and Yang, Kaichen and Jin, Yier}, }