Harred, Rachel, Barnes, Tiffany, Fisk, Susan R., Akram, Bita, Price, Thomas W., and Yoder, Spencer. Do Intentions to Persist Predict Short-Term Computing Course Enrollments: A Scale Development, Validation, and Reliability Analysis. Retrieved from https://par.nsf.gov/biblio/10463701. Proceedings of the 54th ACM Technical Symposium on Computer Science Education 1. Web. doi:10.1145/3545945.3569875.

Harred, Rachel, Barnes, Tiffany, Fisk, Susan R., Akram, Bita, Price, Thomas W., & Yoder, Spencer. Do Intentions to Persist Predict Short-Term Computing Course Enrollments: A Scale Development, Validation, and Reliability Analysis. Proceedings of the 54th ACM Technical Symposium on Computer Science Education, 1 (). Retrieved from https://par.nsf.gov/biblio/10463701. https://doi.org/10.1145/3545945.3569875

Harred, Rachel, Barnes, Tiffany, Fisk, Susan R., Akram, Bita, Price, Thomas W., and Yoder, Spencer. "Do Intentions to Persist Predict Short-Term Computing Course Enrollments: A Scale Development, Validation, and Reliability Analysis". Proceedings of the 54th ACM Technical Symposium on Computer Science Education 1 (). Country unknown/Code not available. https://doi.org/10.1145/3545945.3569875. https://par.nsf.gov/biblio/10463701.

@article{osti_10463701,
place = {Country unknown/Code not available}, title = {Do Intentions to Persist Predict Short-Term Computing Course Enrollments: A Scale Development, Validation, and Reliability Analysis}, url = {https://par.nsf.gov/biblio/10463701}, DOI = {10.1145/3545945.3569875}, abstractNote = {}, journal = {Proceedings of the 54th ACM Technical Symposium on Computer Science Education}, volume = {1}, author = {Harred, Rachel and Barnes, Tiffany and Fisk, Susan R. and Akram, Bita and Price, Thomas W. and Yoder, Spencer}, }