Liu, Jienan, Pun, Pooja, Vadrevu, Phani, and Perdisci, Roberto. Understanding, Measuring, and Detecting Modern Technical Support Scams. Retrieved from https://par.nsf.gov/biblio/10465477. 2023 IEEE 8th European Symposium on Security and Privacy (EuroS&P) . Web. doi:10.1109/EuroSP57164.2023.00011.
Liu, Jienan, Pun, Pooja, Vadrevu, Phani, & Perdisci, Roberto. Understanding, Measuring, and Detecting Modern Technical Support Scams. 2023 IEEE 8th European Symposium on Security and Privacy (EuroS&P), (). Retrieved from https://par.nsf.gov/biblio/10465477. https://doi.org/10.1109/EuroSP57164.2023.00011
Liu, Jienan, Pun, Pooja, Vadrevu, Phani, and Perdisci, Roberto.
"Understanding, Measuring, and Detecting Modern Technical Support Scams". 2023 IEEE 8th European Symposium on Security and Privacy (EuroS&P) (). Country unknown/Code not available. https://doi.org/10.1109/EuroSP57164.2023.00011.https://par.nsf.gov/biblio/10465477.
@article{osti_10465477,
place = {Country unknown/Code not available},
title = {Understanding, Measuring, and Detecting Modern Technical Support Scams},
url = {https://par.nsf.gov/biblio/10465477},
DOI = {10.1109/EuroSP57164.2023.00011},
abstractNote = {},
journal = {2023 IEEE 8th European Symposium on Security and Privacy (EuroS&P)},
author = {Liu, Jienan and Pun, Pooja and Vadrevu, Phani and Perdisci, Roberto},
}
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