Abstract We report on the structure and dielectric properties of ternary A6B2O17(A = Zr; B = Nb, Ta) thin films and ceramics. Thin films are produced via sputter deposition from dense, phase‐homogenous bulk ceramic targets, which are synthesized through a reactive sintering process at 1500°C. Crystal structure, microstructure, chemistry, and dielectric properties are characterized by X‐ray diffraction and reflectivity, atomic force microscopy, X‐ray photoelectron spectroscopy, and capacitance analysis, respectively. We observe relative permittivities approaching 60 and loss tangents <1 × 10−2across the 103–105 Hz frequency range in the Zr6Nb2O17and Zr6Ta2O17phases. These observations create an opportunity space for this novel class of disordered oxide electroceramics.
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Structural and thermodynamic analysis of metal filler incorporations in Si a O b (M) c C d polymer derived ceramics: Ta, Hf, Nb
Abstract This work systematically investigates the thermodynamic stability of SiaOb(M)cCdstructures derived from polymeric precursors incorporating metal fillers: Ta, Nb, and Hf, at 1200 and 1500°C. Structural characterization of the polymer derived ceramics (PDCs) employs X‐ray diffraction, Fourier transform infrared spectroscopy, and X‐ray photoelectron spectroscopy. Enthalpies of formation relative to crystalline components (metal oxide, silica, silicon carbide, and graphite) are obtained from thermodynamic measurements by high temperature oxide melt solution calorimetry. The enthalpies of formation (∆H°f, comp) of Ta‐1200, Hf‐1200, Nb‐1200, Ta‐1500, Hf‐1500, and Nb‐1500 specimens are −137.82 ± 9.72, −256.31 ± 8.97, −82.80 ± 9.82, −182.80 ± 7.85, −292.54 ± 9.38, −224.98 ± 9.60 kJ/mol, respectively. Overall incorporation of Hf results in most thermodynamically stable structures at all synthesis temperatures. SiaOb(M)cCdspecimens employing Nb fillers undergo the most stable structural evolution in this temperature range. The results indicate strong thermodynamic drive for carbothermal reduction of metal oxide domains. Incorporation of Ta provides the greatest stabilization of SiO3C mixed bonding environments. Ultimately, the choice of metal filler influences composition, structural evolution, and thermodynamic stability in PDCs.
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- Award ID(s):
- 1743701
- PAR ID:
- 10469318
- Publisher / Repository:
- Wiley
- Date Published:
- Journal Name:
- International Journal of Applied Ceramic Technology
- Volume:
- 20
- Issue:
- 6
- ISSN:
- 1546-542X
- Page Range / eLocation ID:
- 3395 to 3406
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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The electrical properties of the entropy stabilized oxides: Zr6Nb2O17, Zr6Ta2O17, Hf6Nb2O17and Hf6Ta2O17were characterized. The results and the electrical properties of the products (i.e. ZrO2, HfO2, Nb2O5and Ta2O5) led us to hypothesize the A6B2O17family is a series of mixed ionic-electronic conductors. Conductivity measurements in varying oxygen partial pressure were performed on A6Nb2O17and A6Ta2O17.The results indicate that electrons are involved in conduction in A6Nb2O17while holes play a role in conduction of A6Ta2O17. Between 900 °C–950 °C, the charge transport in the A6B2O17system increases in Ar atmosphere. A combination of DTA/DSC and in situ high temperature X-ray diffraction was performed to identify a potential mechanism for this increase. In-situ high temperature X-ray diffraction in Ar does not show any phase transformation. Based on this, it is hypothesized that a change in the oxygen sub-lattice is the cause for the shift in high temperature conduction above 900 °C–950 °C. This could be:(i)Nb(Ta)4+- oxygen vacancy associate formation/dissociation,(ii)formation of oxygen/oxygen vacancy complexes(iii)ordering/disordering of oxygen vacancies and/or(iv)oxygen-based superstructure commensurate or incommensurate transitions. In-situ high temperature neutron diffraction up to 1050 °C is required to help elucidate the origins of this large increase in conductivity.more » « less
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