Freeman, M., Applestone, R., Behn, W., and Brar, V. Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control. Retrieved from https://par.nsf.gov/biblio/10470171. Ultramicroscopy 255.C Web. doi:10.1016/j.ultramic.2023.113856.

Freeman, M., Applestone, R., Behn, W., & Brar, V. Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control. Ultramicroscopy, 255 (C). Retrieved from https://par.nsf.gov/biblio/10470171. https://doi.org/10.1016/j.ultramic.2023.113856

Freeman, M., Applestone, R., Behn, W., and Brar, V. "Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control". Ultramicroscopy 255 (C). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.ultramic.2023.113856. https://par.nsf.gov/biblio/10470171.

@article{osti_10470171,
place = {Country unknown/Code not available}, title = {Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control}, url = {https://par.nsf.gov/biblio/10470171}, DOI = {10.1016/j.ultramic.2023.113856}, abstractNote = {}, journal = {Ultramicroscopy}, volume = {255}, number = {C}, publisher = {Elsevier}, author = {Freeman, M. and Applestone, R. and Behn, W. and Brar, V.}, }