Yu, Kehang, Wang, Xin, Mahajan, Subhash, Beyerlein, Irene J., Cao, Penghui, Rupert, Timothy J., Schoenung, Julie M., and Lavernia, Enrique J. Twin nucleation from disconnection-dense sites between stacking fault pairs in a random defect network. Retrieved from https://par.nsf.gov/biblio/10471366. Materialia 30.C Web. doi:10.1016/j.mtla.2023.101835.

Yu, Kehang, Wang, Xin, Mahajan, Subhash, Beyerlein, Irene J., Cao, Penghui, Rupert, Timothy J., Schoenung, Julie M., & Lavernia, Enrique J. Twin nucleation from disconnection-dense sites between stacking fault pairs in a random defect network. Materialia, 30 (C). Retrieved from https://par.nsf.gov/biblio/10471366. https://doi.org/10.1016/j.mtla.2023.101835

Yu, Kehang, Wang, Xin, Mahajan, Subhash, Beyerlein, Irene J., Cao, Penghui, Rupert, Timothy J., Schoenung, Julie M., and Lavernia, Enrique J. "Twin nucleation from disconnection-dense sites between stacking fault pairs in a random defect network". Materialia 30 (C). Country unknown/Code not available: Elsevier B.V.. https://doi.org/10.1016/j.mtla.2023.101835. https://par.nsf.gov/biblio/10471366.

@article{osti_10471366,
place = {Country unknown/Code not available}, title = {Twin nucleation from disconnection-dense sites between stacking fault pairs in a random defect network}, url = {https://par.nsf.gov/biblio/10471366}, DOI = {10.1016/j.mtla.2023.101835}, abstractNote = {}, journal = {Materialia}, volume = {30}, number = {C}, publisher = {Elsevier B.V.}, author = {Yu, Kehang and Wang, Xin and Mahajan, Subhash and Beyerlein, Irene J. and Cao, Penghui and Rupert, Timothy J. and Schoenung, Julie M. and Lavernia, Enrique J.}, }