On-machine metrology for diamond turning applications

Kang, Wenjun; Wang, Yihan; Ma, Hongzhang; Wang, Daodang; Liang, Rongguang

doi:10.1117/12.2677505

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Citation Details

On-machine metrology for diamond turning applications

Award ID(s):: 1918260

PAR ID:: 10471421

Author(s) / Creator(s):: Kang, Wenjun; Wang, Yihan; Ma, Hongzhang; Wang, Daodang; Liang, Rongguang

Editor(s):: Novak, Erik; Wilcox, Christopher C.

Publisher / Repository:: SPIE

Date Published:: 2023-10-04

ISBN:: 9781510665583

Page Range / eLocation ID:: 7

Format(s):: Medium: X

Location:: San Diego, United States

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Conference Paper:
https://doi.org/10.1117/12.2677505

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