Yoshihara, Yuki, Sugita, Tomoya, Lim, Pang Boey, Tamba, Yasuyuki, Inoue, Hiroaki, Ishiyama, Kazushi, Inoue, Mitsuteru, Ross, Caroline A., and Goto, Taichi. Thickness-dependent magnetooptical properties of ion beam sputtered polycrystalline Ce1Y2Fe5O12 films. Retrieved from https://par.nsf.gov/biblio/10472004. Optical Materials 133.C Web. doi:10.1016/j.optmat.2022.112967.

Yoshihara, Yuki, Sugita, Tomoya, Lim, Pang Boey, Tamba, Yasuyuki, Inoue, Hiroaki, Ishiyama, Kazushi, Inoue, Mitsuteru, Ross, Caroline A., & Goto, Taichi. Thickness-dependent magnetooptical properties of ion beam sputtered polycrystalline Ce1Y2Fe5O12 films. Optical Materials, 133 (C). Retrieved from https://par.nsf.gov/biblio/10472004. https://doi.org/10.1016/j.optmat.2022.112967

Yoshihara, Yuki, Sugita, Tomoya, Lim, Pang Boey, Tamba, Yasuyuki, Inoue, Hiroaki, Ishiyama, Kazushi, Inoue, Mitsuteru, Ross, Caroline A., and Goto, Taichi. "Thickness-dependent magnetooptical properties of ion beam sputtered polycrystalline Ce1Y2Fe5O12 films". Optical Materials 133 (C). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.optmat.2022.112967. https://par.nsf.gov/biblio/10472004.

@article{osti_10472004,
place = {Country unknown/Code not available}, title = {Thickness-dependent magnetooptical properties of ion beam sputtered polycrystalline Ce1Y2Fe5O12 films}, url = {https://par.nsf.gov/biblio/10472004}, DOI = {10.1016/j.optmat.2022.112967}, abstractNote = {}, journal = {Optical Materials}, volume = {133}, number = {C}, publisher = {Elsevier}, author = {Yoshihara, Yuki and Sugita, Tomoya and Lim, Pang Boey and Tamba, Yasuyuki and Inoue, Hiroaki and Ishiyama, Kazushi and Inoue, Mitsuteru and Ross, Caroline A. and Goto, Taichi}, }