Barrio-Zhang, Andres, and Ardekani, Arezoo M. Sub-micron weak phase particle characterization using the reconstructed volume intensities from in-line digital holography microscopy. Retrieved from https://par.nsf.gov/biblio/10480579. Optics and Lasers in Engineering 170.C Web. doi:10.1016/j.optlaseng.2023.107779.

Barrio-Zhang, Andres, & Ardekani, Arezoo M. Sub-micron weak phase particle characterization using the reconstructed volume intensities from in-line digital holography microscopy. Optics and Lasers in Engineering, 170 (C). Retrieved from https://par.nsf.gov/biblio/10480579. https://doi.org/10.1016/j.optlaseng.2023.107779

Barrio-Zhang, Andres, and Ardekani, Arezoo M. "Sub-micron weak phase particle characterization using the reconstructed volume intensities from in-line digital holography microscopy". Optics and Lasers in Engineering 170 (C). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.optlaseng.2023.107779. https://par.nsf.gov/biblio/10480579.

@article{osti_10480579,
place = {Country unknown/Code not available}, title = {Sub-micron weak phase particle characterization using the reconstructed volume intensities from in-line digital holography microscopy}, url = {https://par.nsf.gov/biblio/10480579}, DOI = {10.1016/j.optlaseng.2023.107779}, abstractNote = {}, journal = {Optics and Lasers in Engineering}, volume = {170}, number = {C}, publisher = {Elsevier}, author = {Barrio-Zhang, Andres and Ardekani, Arezoo M.}, }