Myint, Peco, Woodward, Jeffrey M., Wang, Chenyu, Zhang, Xiaozhi, Wiegart, Lutz, Fluerasu, Andrei, Headrick, Randall L., Eddy, Jr., Charles R., and Ludwig, Jr., Karl F.
"Coherent X-ray Spectroscopy Elucidates Nanoscale Dynamics of Plasma-Enhanced Thin-Film Growth". ACS Nano 18 (3). Country unknown/Code not available: American Chemical Society. https://doi.org/10.1021/acsnano.3c07619.https://par.nsf.gov/biblio/10485101.
@article{osti_10485101,
place = {Country unknown/Code not available},
title = {Coherent X-ray Spectroscopy Elucidates Nanoscale Dynamics of Plasma-Enhanced Thin-Film Growth},
url = {https://par.nsf.gov/biblio/10485101},
DOI = {10.1021/acsnano.3c07619},
abstractNote = {Not Available},
journal = {ACS Nano},
volume = {18},
number = {3},
publisher = {American Chemical Society},
author = {Myint, Peco and Woodward, Jeffrey M. and Wang, Chenyu and Zhang, Xiaozhi and Wiegart, Lutz and Fluerasu, Andrei and Headrick, Randall L. and Eddy, Jr., Charles R. and Ludwig, Jr., Karl F.},
}
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