Error Resilient Sleep Convention Logic Asynchronous Circuit Design

Datta, Mithun; Bodoh, Alexander; Sakib, Ashiq A.

doi:10.1109/NEWCAS57931.2023.10198041

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Citation Details

Error Resilient Sleep Convention Logic Asynchronous Circuit Design

Award ID(s):: 2153373

PAR ID:: 10492965

Author(s) / Creator(s):: Datta, Mithun; Bodoh, Alexander; Sakib, Ashiq A.

Publisher / Repository:: IEEE

Date Published:: 2023-06-26

ISBN:: 979-8-3503-0024-6

Page Range / eLocation ID:: 1 to 5

Subject(s) / Keyword(s):: Asynchronous design Sleep Convention Logic (SCL) Single event upset (SEU) Single event latch-up (SEL)

Format(s):: Medium: X

Location:: Edinburgh, United Kingdom

Sponsoring Org:: National Science Foundation

Conference Paper:
https://doi.org/10.1109/NEWCAS57931.2023.10198041

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