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Title: Error Resilient Sleep Convention Logic Asynchronous Circuit Design
Award ID(s):
2153373
PAR ID:
10492965
Author(s) / Creator(s):
; ;
Publisher / Repository:
IEEE
Date Published:
ISBN:
979-8-3503-0024-6
Page Range / eLocation ID:
1 to 5
Subject(s) / Keyword(s):
Asynchronous design Sleep Convention Logic (SCL) Single event upset (SEU) Single event latch-up (SEL)
Format(s):
Medium: X
Location:
Edinburgh, United Kingdom
Sponsoring Org:
National Science Foundation
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