Mazumder, Dipayan, Datta, Mithun, Bodoh, Alexander C., and Sakib, Ashiq A. A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits. Retrieved from https://par.nsf.gov/biblio/10492969. Journal of Low Power Electronics and Applications 14.1 Web. doi:10.3390/jlpea14010005.

Mazumder, Dipayan, Datta, Mithun, Bodoh, Alexander C., & Sakib, Ashiq A. A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits. Journal of Low Power Electronics and Applications, 14 (1). Retrieved from https://par.nsf.gov/biblio/10492969. https://doi.org/10.3390/jlpea14010005

Mazumder, Dipayan, Datta, Mithun, Bodoh, Alexander C., and Sakib, Ashiq A. "A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits". Journal of Low Power Electronics and Applications 14 (1). Country unknown/Code not available: MDPI. https://doi.org/10.3390/jlpea14010005. https://par.nsf.gov/biblio/10492969.

@article{osti_10492969,
place = {Country unknown/Code not available}, title = {A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits}, url = {https://par.nsf.gov/biblio/10492969}, DOI = {10.3390/jlpea14010005}, abstractNote = {}, journal = {Journal of Low Power Electronics and Applications}, volume = {14}, number = {1}, publisher = {MDPI}, author = {Mazumder, Dipayan and Datta, Mithun and Bodoh, Alexander C. and Sakib, Ashiq A.}, }