Blankenship, Brian_W, Meier, Timon, Arvin, Sophia_Lafia, Li, Jingang, Seymour, Nathan, De_La_Torre, Natalia, Hsu, Brian, Zhao, Naichen, Mavrikos, Stefanos, Li, Runxuan, and Grigoropoulos, Costas_P. Nondestructive Imaging of Manufacturing Defects in Microarchitected Materials. ACS Applied Engineering Materials 2.7 Web. doi:10.1021/acsaenm.4c00160.

Blankenship, Brian_W, Meier, Timon, Arvin, Sophia_Lafia, Li, Jingang, Seymour, Nathan, De_La_Torre, Natalia, Hsu, Brian, Zhao, Naichen, Mavrikos, Stefanos, Li, Runxuan, & Grigoropoulos, Costas_P. Nondestructive Imaging of Manufacturing Defects in Microarchitected Materials. ACS Applied Engineering Materials, 2 (7). https://doi.org/10.1021/acsaenm.4c00160

Blankenship, Brian_W, Meier, Timon, Arvin, Sophia_Lafia, Li, Jingang, Seymour, Nathan, De_La_Torre, Natalia, Hsu, Brian, Zhao, Naichen, Mavrikos, Stefanos, Li, Runxuan, and Grigoropoulos, Costas_P. "Nondestructive Imaging of Manufacturing Defects in Microarchitected Materials". ACS Applied Engineering Materials 2 (7). Country unknown/Code not available: American Chemical Society. https://doi.org/10.1021/acsaenm.4c00160. https://par.nsf.gov/biblio/10500624.

@article{osti_10500624,
place = {Country unknown/Code not available}, title = {Nondestructive Imaging of Manufacturing Defects in Microarchitected Materials}, url = {https://par.nsf.gov/biblio/10500624}, DOI = {10.1021/acsaenm.4c00160}, abstractNote = {Not Available}, journal = {ACS Applied Engineering Materials}, volume = {2}, number = {7}, publisher = {American Chemical Society}, author = {Blankenship, Brian_W and Meier, Timon and Arvin, Sophia_Lafia and Li, Jingang and Seymour, Nathan and De_La_Torre, Natalia and Hsu, Brian and Zhao, Naichen and Mavrikos, Stefanos and Li, Runxuan and Grigoropoulos, Costas_P}, }