Nolan, Gillian, Han, Edmund, Nahid, Shahriar Muhammad, van der Zande, Arend M, Schleife, André, and Huang, Pinshane. Imaging Charged Domain Walls in van der Waals Ferroelectric α-In2Se3 via 4D-STEM. Retrieved from https://par.nsf.gov/biblio/10502498. Microscopy and Microanalysis 29.Supplement_1 Web. doi:10.1093/micmic/ozad067.846.

Nolan, Gillian, Han, Edmund, Nahid, Shahriar Muhammad, van der Zande, Arend M, Schleife, André, & Huang, Pinshane. Imaging Charged Domain Walls in van der Waals Ferroelectric α-In2Se3 via 4D-STEM. Microscopy and Microanalysis, 29 (Supplement_1). Retrieved from https://par.nsf.gov/biblio/10502498. https://doi.org/10.1093/micmic/ozad067.846

Nolan, Gillian, Han, Edmund, Nahid, Shahriar Muhammad, van der Zande, Arend M, Schleife, André, and Huang, Pinshane. "Imaging Charged Domain Walls in van der Waals Ferroelectric α-In2Se3 via 4D-STEM". Microscopy and Microanalysis 29 (Supplement_1). Country unknown/Code not available: Microscopy and Microanalysis. https://doi.org/10.1093/micmic/ozad067.846. https://par.nsf.gov/biblio/10502498.

@article{osti_10502498,
place = {Country unknown/Code not available}, title = {Imaging Charged Domain Walls in van der Waals Ferroelectric α-In2Se3 via 4D-STEM}, url = {https://par.nsf.gov/biblio/10502498}, DOI = {10.1093/micmic/ozad067.846}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {29}, number = {Supplement_1}, publisher = {Microscopy and Microanalysis}, author = {Nolan, Gillian and Han, Edmund and Nahid, Shahriar Muhammad and van der Zande, Arend M and Schleife, André and Huang, Pinshane}, }