Coughlan, Mark F., Pettinato, Giuseppe, Glyavina, Maria M., Zhang, Xuejun, Chen, Liming, Khan, Umar, Upputuri, Paul K., Zakharov, Yuri N., Zhang, Lei, Qiu, Le, and Perelman, Lev T. C-CLASS microscopy allows the detection of nanoscale changes in chromatin structure. Retrieved from https://par.nsf.gov/biblio/10502709. Proc. of SPIE . Web. doi:10.1117/12.2667044.

Coughlan, Mark F., Pettinato, Giuseppe, Glyavina, Maria M., Zhang, Xuejun, Chen, Liming, Khan, Umar, Upputuri, Paul K., Zakharov, Yuri N., Zhang, Lei, Qiu, Le, & Perelman, Lev T. C-CLASS microscopy allows the detection of nanoscale changes in chromatin structure. Proc. of SPIE, (). Retrieved from https://par.nsf.gov/biblio/10502709. https://doi.org/10.1117/12.2667044

Coughlan, Mark F., Pettinato, Giuseppe, Glyavina, Maria M., Zhang, Xuejun, Chen, Liming, Khan, Umar, Upputuri, Paul K., Zakharov, Yuri N., Zhang, Lei, Qiu, Le, and Perelman, Lev T. "C-CLASS microscopy allows the detection of nanoscale changes in chromatin structure". Proc. of SPIE (). Country unknown/Code not available: SPIE. https://doi.org/10.1117/12.2667044. https://par.nsf.gov/biblio/10502709.

@article{osti_10502709,
place = {Country unknown/Code not available}, title = {C-CLASS microscopy allows the detection of nanoscale changes in chromatin structure}, url = {https://par.nsf.gov/biblio/10502709}, DOI = {10.1117/12.2667044}, abstractNote = {}, journal = {Proc. of SPIE}, publisher = {SPIE}, author = {Coughlan, Mark F. and Pettinato, Giuseppe and Glyavina, Maria M. and Zhang, Xuejun and Chen, Liming and Khan, Umar and Upputuri, Paul K. and Zakharov, Yuri N. and Zhang, Lei and Qiu, Le and Perelman, Lev T.}, editor = {Beaurepaire, Emmanuel and Ben-Yakar, Adela and Park, YongKeun} }