Chen, Shangyi, Lust, Mark, Roo, Annie, and Ghalichechian, Nima. Reliability of VO2-Based mmWave Switches Under 100 Million Thermal Cycles. Retrieved from https://par.nsf.gov/biblio/10504102. IEEE Transactions on Device and Materials Reliability 23.2 Web. doi:10.1109/TDMR.2023.3249771.

Chen, Shangyi, Lust, Mark, Roo, Annie, & Ghalichechian, Nima. Reliability of VO2-Based mmWave Switches Under 100 Million Thermal Cycles. IEEE Transactions on Device and Materials Reliability, 23 (2). Retrieved from https://par.nsf.gov/biblio/10504102. https://doi.org/10.1109/TDMR.2023.3249771

Chen, Shangyi, Lust, Mark, Roo, Annie, and Ghalichechian, Nima. "Reliability of VO2-Based mmWave Switches Under 100 Million Thermal Cycles". IEEE Transactions on Device and Materials Reliability 23 (2). Country unknown/Code not available: IEEE, https://ieeexplore.ieee.org. https://doi.org/10.1109/TDMR.2023.3249771. https://par.nsf.gov/biblio/10504102.

@article{osti_10504102,
place = {Country unknown/Code not available}, title = {Reliability of VO2-Based mmWave Switches Under 100 Million Thermal Cycles}, url = {https://par.nsf.gov/biblio/10504102}, DOI = {10.1109/TDMR.2023.3249771}, abstractNote = {}, journal = {IEEE Transactions on Device and Materials Reliability}, volume = {23}, number = {2}, publisher = {IEEE, https://ieeexplore.ieee.org}, author = {Chen, Shangyi and Lust, Mark and Roo, Annie and Ghalichechian, Nima}, }