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Abstract The visualization of pure phase objects by wavefront sensing has important applications ranging from surface profiling to biomedical microscopy, and generally requires bulky and complicated setups involving optical spatial filtering, interferometry, or structured illumination. Here we introduce a new type of image sensors that are uniquely sensitive to the local direction of light propagation, based on standard photodetectors coated with a specially designed plasmonic metasurface that creates an asymmetric dependence of responsivity on angle of incidence around the surface normal. The metasurface design, fabrication, and angle-sensitive operation are demonstrated using a simple photoconductive detector platform. The measurement results, combined with computational imaging calculations, are then used to show that a standard camera or microscope based on these metasurface pixels can directly visualize phase objects without any additional optical elements, with state-of-the-art minimum detectable phase contrasts below 10 mrad. Furthermore, the combination of sensors with equal and opposite angular response on the same pixel array can be used to perform quantitative phase imaging in a single shot, with a customized reconstruction algorithm which is also developed in this work. By virtue of its system miniaturization and measurement simplicity, the phase imaging approach enabled by these devices is particularly significant for applications involving space-constrained and portable setups (such as point-of-care imaging and endoscopy) and measurements involving freely moving objects.
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This content will become publicly available on June 5, 2025
Metasurface‐Based Mueller Matrix Microscope
Abstract In conventional optical microscopes, image contrast of objects mainly results from the differences in light intensity and/or color. Muller matrix optical microscopes (MMMs), on the other hand, can provide significantly enhanced image contrast and rich information about objects by analyzing their interactions with polarized light. However, state‐of‐the‐art MMMs are fundamentally limited by bulky and slow polarization state generators and analyzers. Here, the study demonstrates a metasurface‐based MMM, i.e., Meta‐MMM, which is equipped with a chip‐integrated, single‐shot metasurface polarization state analyzer (Meta‐PSA). The Meta‐MMM is featured with high‐speed measurement (≈2s per Muller matrix (MM) image), superior operation stability, dual‐color operation, and high measurement accuracy (measurement error 1–2%) for MM imaging. The Meta‐MMM is applied to nanostructure characterization, surface morphology analysis, and discovering birefringent structures in honeybee wings. The Meta‐MMMs hold the promise to revolutionize various applications from biological imaging, medical diagnosis, and material characterization to industry inspection and space exploration.
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- PAR ID:
- 10519705
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Advanced Functional Materials
- ISSN:
- 1616-301X
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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