Multiple testing under negative dependence

Chi, Ziyu; Ramdas, Aaditya; Wang, Ruodu

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Citation Details

Multiple testing under negative dependence

Award ID(s):: 1945266 2310718

PAR ID:: 10520593

Author(s) / Creator(s):: Chi, Ziyu; Ramdas, Aaditya; Wang, Ruodu

Publisher / Repository:: Bernoulli Society for Mathematical Statistics and Probability

Date Published:: 2024-07-03

Journal Name:: Bernoulli

ISSN:: 1350-7265

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

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Accepted Manuscript1.0
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