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Title: Measuring Phase and Symmetries in STEM-EELS
Award ID(s):
2309314 2012191
PAR ID:
10521023
Author(s) / Creator(s):
; ;
Publisher / Repository:
Microscopy and Microanalysis
Date Published:
Journal Name:
Microscopy and Microanalysis
Volume:
29
Issue:
Supplement_1
ISSN:
1431-9276
Page Range / eLocation ID:
374 to 375
Subject(s) / Keyword(s):
electron interferometry electron microscopy STEM-EELS
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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