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Abstract Enhanced and controlled light absorption, as well as field confinement in optically thin materials, are pivotal for energy‐efficient optoelectronics and nonlinear optical devices. Highly doped transparent conducting oxide (TCO) thin films can support the so‐called epsilon near zero (ENZ) modes in a frequency region of near‐zero permittivity, which can lead to the perfect light absorption and ultrastrong electric field intensity enhancement (FIE) within the films. To achieve full control over absorption and FIE, one must be able to tune the ENZ material properties as well as the film thickness. Here, engineered absorption and FIE are experimentally demonstrated in aluminum‐doped zinc oxide (AZO) thin films via control of their ENZ wavelengths, optical losses, and film thicknesses, tuned by adjusting the atomic layer deposition (ALD) parameters such as dopant ratio, deposition temperature, and the number of macrocycles. It is also demonstrated that under ENZ mode excitation, though the absorption and FIE are inherently related, the film thickness required for observing maximum absorption differs significantly from that for maximum FIE. This study on engineering ENZ material properties by optimizing the ALD process will be beneficial for the design and development of next‐generation tailorable photonic devices based on flat, zero‐index optics.
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Vertical Thermal Emission from Optical Antennas on an Epsilon‐Near–Zero Substrate
Abstract This work presents a novel approach to achieve directional and normal thermal emission from epsilon‐near–zero (ENZ) materials. ENZ materials exhibit near–zero permittivity at the ENZ point, resulting in some unique properties compared to conventional optical materials including infinite wavelength, constant phase distribution, and decoupling of spatial and temporal fields inside the ENZ material. These properties are used to engineer the far‐field thermal emission from optical antennas fabricated on ENZ film in the mid‐infrared. By coupling the antenna resonance mode with the Berreman mode of the ENZ material, highly directional and normal emission is demonstrated. This approach could have significant implications for thermal management, energy conversion, and sensing applications.
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- Award ID(s):
- 2118787
- PAR ID:
- 10528375
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Advanced Optical Materials
- Volume:
- 12
- Issue:
- 25
- ISSN:
- 2195-1071
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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