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Title: A Testing Based Approach for Security Analysis of Smart Semiconductor Systems
Award ID(s):
2046588
PAR ID:
10528837
Author(s) / Creator(s):
; ;
Publisher / Repository:
IEEE
Date Published:
Journal Name:
Proceedings Winter Simulation Conference
ISSN:
1558-4305
ISBN:
979-8-3503-6966-3
Page Range / eLocation ID:
2286 to 2297
Format(s):
Medium: X
Location:
San Antonio, TX, USA
Sponsoring Org:
National Science Foundation
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