Miller, Lohra M, Young, Tanner W, Wang, Yi, Draper, Benjamin E, Ye, Xingchen, Jacobson, Stephen C, and Jarrold, Martin F. Complementary Nanoparticle Characterization by Resistive-Pulse Sensing, Electron Microscopy, and Charge Detection Mass Spectrometry. Retrieved from https://par.nsf.gov/biblio/10537290. Analytical Chemistry . Web. doi:10.1021/acs.analchem.4c02901.

Miller, Lohra M, Young, Tanner W, Wang, Yi, Draper, Benjamin E, Ye, Xingchen, Jacobson, Stephen C, & Jarrold, Martin F. Complementary Nanoparticle Characterization by Resistive-Pulse Sensing, Electron Microscopy, and Charge Detection Mass Spectrometry. Analytical Chemistry, (). Retrieved from https://par.nsf.gov/biblio/10537290. https://doi.org/10.1021/acs.analchem.4c02901

Miller, Lohra M, Young, Tanner W, Wang, Yi, Draper, Benjamin E, Ye, Xingchen, Jacobson, Stephen C, and Jarrold, Martin F. "Complementary Nanoparticle Characterization by Resistive-Pulse Sensing, Electron Microscopy, and Charge Detection Mass Spectrometry". Analytical Chemistry (). Country unknown/Code not available: ACS Publications. https://doi.org/10.1021/acs.analchem.4c02901. https://par.nsf.gov/biblio/10537290.

@article{osti_10537290,
place = {Country unknown/Code not available}, title = {Complementary Nanoparticle Characterization by Resistive-Pulse Sensing, Electron Microscopy, and Charge Detection Mass Spectrometry}, url = {https://par.nsf.gov/biblio/10537290}, DOI = {10.1021/acs.analchem.4c02901}, abstractNote = {}, journal = {Analytical Chemistry}, publisher = {ACS Publications}, author = {Miller, Lohra M and Young, Tanner W and Wang, Yi and Draper, Benjamin E and Ye, Xingchen and Jacobson, Stephen C and Jarrold, Martin F}, }