Kasher, Tal, Kaliszewski, Lauren M, Lepkowski, Daniel L, Boyer, Jacob T, Baan, Marzieh, Grassman, Tyler J, and Ringel, Steven A. Design for Increased Defect Tolerance in Metamorphic GaAsP-on-Si Top Cells. Retrieved from https://par.nsf.gov/biblio/10547207. IEEE Journal of Photovoltaics . Web. doi:10.1109/JPHOTOV.2024.3463974.

Kasher, Tal, Kaliszewski, Lauren M, Lepkowski, Daniel L, Boyer, Jacob T, Baan, Marzieh, Grassman, Tyler J, & Ringel, Steven A. Design for Increased Defect Tolerance in Metamorphic GaAsP-on-Si Top Cells. IEEE Journal of Photovoltaics, (). Retrieved from https://par.nsf.gov/biblio/10547207. https://doi.org/10.1109/JPHOTOV.2024.3463974

Kasher, Tal, Kaliszewski, Lauren M, Lepkowski, Daniel L, Boyer, Jacob T, Baan, Marzieh, Grassman, Tyler J, and Ringel, Steven A. "Design for Increased Defect Tolerance in Metamorphic GaAsP-on-Si Top Cells". IEEE Journal of Photovoltaics (). Country unknown/Code not available: IEEE Xplore. https://doi.org/10.1109/JPHOTOV.2024.3463974. https://par.nsf.gov/biblio/10547207.

@article{osti_10547207,
place = {Country unknown/Code not available}, title = {Design for Increased Defect Tolerance in Metamorphic GaAsP-on-Si Top Cells}, url = {https://par.nsf.gov/biblio/10547207}, DOI = {10.1109/JPHOTOV.2024.3463974}, abstractNote = {}, journal = {IEEE Journal of Photovoltaics}, publisher = {IEEE Xplore}, author = {Kasher, Tal and Kaliszewski, Lauren M and Lepkowski, Daniel L and Boyer, Jacob T and Baan, Marzieh and Grassman, Tyler J and Ringel, Steven A}, }