Fine-grained Local Sensitivity Analysis of Standard Dot-Product Self-Attention

Havens, AJ; Araujo, A; Zhang, H; Hu, B

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Citation Details

This content will become publicly available on July 13, 2025

Fine-grained Local Sensitivity Analysis of Standard Dot-Product Self-Attention

Award ID(s):: 2331967

PAR ID:: 10547648

Author(s) / Creator(s):: Havens, AJ; Araujo, A; Zhang, H; Hu, B

Publisher / Repository:: Forty-first International Conference on Machine Learning

Date Published:: 2024-07-13

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
This content will become publicly available on July 13, 2025
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