Ortega, Eduardo, Talukdar, Jonti, Paik, Woohyun, Bletsch, Tyler, and Chakrabarty, Krishnendu. Rowhammer Vulnerability of DRAMs in 3-D Integration. Retrieved from https://par.nsf.gov/biblio/10547814. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 32.5 Web. doi:10.1109/TVLSI.2024.3368044.

Ortega, Eduardo, Talukdar, Jonti, Paik, Woohyun, Bletsch, Tyler, & Chakrabarty, Krishnendu. Rowhammer Vulnerability of DRAMs in 3-D Integration. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 32 (5). Retrieved from https://par.nsf.gov/biblio/10547814. https://doi.org/10.1109/TVLSI.2024.3368044

Ortega, Eduardo, Talukdar, Jonti, Paik, Woohyun, Bletsch, Tyler, and Chakrabarty, Krishnendu. "Rowhammer Vulnerability of DRAMs in 3-D Integration". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 32 (5). Country unknown/Code not available: IEEE. https://doi.org/10.1109/TVLSI.2024.3368044. https://par.nsf.gov/biblio/10547814.

@article{osti_10547814,
place = {Country unknown/Code not available}, title = {Rowhammer Vulnerability of DRAMs in 3-D Integration}, url = {https://par.nsf.gov/biblio/10547814}, DOI = {10.1109/TVLSI.2024.3368044}, abstractNote = {}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, volume = {32}, number = {5}, publisher = {IEEE}, author = {Ortega, Eduardo and Talukdar, Jonti and Paik, Woohyun and Bletsch, Tyler and Chakrabarty, Krishnendu}, }