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Title: Exploring Initiation-Growth Correlation in Accelerated Degradation Testing Data: Both Classical and Bayesian Approaches
Award ID(s):
2412020 2134409
PAR ID:
10552227
Author(s) / Creator(s):
; ; ; ;
Publisher / Repository:
IEEE
Date Published:
Journal Name:
IEEE Transactions on Reliability
ISSN:
0018-9529
Page Range / eLocation ID:
1 to 13
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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