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Title: High Temperature Characterization and Degradation Test of a Cascode Gallium Nitride Field Effect Transistor
Award ID(s):
2327474
PAR ID:
10563684
Author(s) / Creator(s):
; ; ;
Publisher / Repository:
2024 IEEE 11th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)
Date Published:
ISSN:
2687-8577
ISBN:
979-8-3503-7560-2
Format(s):
Medium: X
Location:
Dayton, OH, USA
Sponsoring Org:
National Science Foundation
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