Sun, Ze, Wang, Yansheng, and Kim, DongHyun. System-Level Validation of Radiated Noise Source Characterization Using Only Near-Field Magnitude Information. Retrieved from https://par.nsf.gov/biblio/10565614. IEEE Letters on Electromagnetic Compatibility Practice and Applications 6.1 Web. doi:10.1109/LEMCPA.2023.3330402.

Sun, Ze, Wang, Yansheng, & Kim, DongHyun. System-Level Validation of Radiated Noise Source Characterization Using Only Near-Field Magnitude Information. IEEE Letters on Electromagnetic Compatibility Practice and Applications, 6 (1). Retrieved from https://par.nsf.gov/biblio/10565614. https://doi.org/10.1109/LEMCPA.2023.3330402

Sun, Ze, Wang, Yansheng, and Kim, DongHyun. "System-Level Validation of Radiated Noise Source Characterization Using Only Near-Field Magnitude Information". IEEE Letters on Electromagnetic Compatibility Practice and Applications 6 (1). Country unknown/Code not available: IEEE. https://doi.org/10.1109/LEMCPA.2023.3330402. https://par.nsf.gov/biblio/10565614.

@article{osti_10565614,
place = {Country unknown/Code not available}, title = {System-Level Validation of Radiated Noise Source Characterization Using Only Near-Field Magnitude Information}, url = {https://par.nsf.gov/biblio/10565614}, DOI = {10.1109/LEMCPA.2023.3330402}, abstractNote = {}, journal = {IEEE Letters on Electromagnetic Compatibility Practice and Applications}, volume = {6}, number = {1}, publisher = {IEEE}, author = {Sun, Ze and Wang, Yansheng and Kim, DongHyun}, }