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We present sensitive HI imaging of the "Almost Dark" galaxies AGC229385 and AGC229101. Selected from the ALFALFA survey, "Almost Dark" galaxies have significant HI reservoirs but lack an obvious stellar counterpart in survey-depth ground-based optical imaging. Deeper ground- and space-based imaging reveals very low surface brightness optical counterparts in both systems. The resulting M_HI/L_B ratios are among the highest ever measured for individual galaxies. Here we combine VLA and WSRT imaging of these two systems, allowing us to preserve surface brightness sensitivity while working at high angular resolution. The resulting maps of HI mass surface density, velocity field, and velocity dispersion are compared to deep optical and ultraviolet imaging. In both systems the highest column density HI gas is clumpy and resolved into multiple components. In the case of AGC229385, the kinematics are inconsistent with a simple rotating disk and may be the result of either an infall episode or an interaction between two HI-rich disks.Support for this work was provided by NSF grant 1211683 to JMC at Macalester College.
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This content will become publicly available on December 1, 2025
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images
Imaging nanomaterials in hybrid systems is critical to understanding the structure and functionality of these systems. However, current technologies such as scanning electron microscopy (SEM) may obtain high resolution/contrast images at the cost of damaging or contaminating the sample. For example, to prevent the charging of organic substrate/matrix, a very thin layer of metal is coated on the surface, which will permanently contaminate the sample and eliminate the possibility of reusing it for following processes. Conversely, examining the sample without any modifications, in pursuit of high-fidelity digital images of its unperturbed state, can come at the cost of low-quality images that are challenging to process. Here, a solution is proposed for the case where no rightness threshold is available to reliably judge whether a region is covered with nanomaterials. The method examines local brightness variability to detect nanomaterial deposits. Very good agreement with manually obtained values of the coverage is observed, and a strong case is made for the method’s automatability. Although the developed methodology is showcased in the context of SEM images of Polydimethylsiloxane (PDMS) substrates on which silicone dioxide (SiO2) nanoparticles are assembled, the underlying concepts may be extended to situations where straightforward brightness thresholding is not viable.
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- Award ID(s):
- 2003077
- PAR ID:
- 10600301
- Publisher / Repository:
- Elsevier
- Date Published:
- Journal Name:
- Ultramicroscopy
- Volume:
- 267
- Issue:
- C
- ISSN:
- 0304-3991
- Page Range / eLocation ID:
- 114048
- Subject(s) / Keyword(s):
- SEM Imaging Weak contrast Image processing Nanoparticle coverage
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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