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This content will become publicly available on April 27, 2026

Title: Takuan: Using Dynamic Invariants to Debug Order-Dependent Flaky Tests
Award ID(s):
2145774 2338287 2217696
PAR ID:
10611247
Author(s) / Creator(s):
; ; ; ;
Publisher / Repository:
IEEE
Date Published:
ISBN:
979-8-3315-3711-1
Page Range / eLocation ID:
81 to 85
Format(s):
Medium: X
Location:
Ottawa, ON, Canada
Sponsoring Org:
National Science Foundation
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