Khan, M_Shafkat M, Biswas, Liton Kumar, Kottur, Himanandhan Reddy, Noor, Rouhan, Varshney, Nitin, Hastings, Nelson, and Asadizanjani, Navid. Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks. Retrieved from https://par.nsf.gov/biblio/10614527. IEEE Design & Test 42.4 Web. doi:10.1109/MDAT.2025.3541192.

Khan, M_Shafkat M, Biswas, Liton Kumar, Kottur, Himanandhan Reddy, Noor, Rouhan, Varshney, Nitin, Hastings, Nelson, & Asadizanjani, Navid. Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks. IEEE Design & Test, 42 (4). Retrieved from https://par.nsf.gov/biblio/10614527. https://doi.org/10.1109/MDAT.2025.3541192

Khan, M_Shafkat M, Biswas, Liton Kumar, Kottur, Himanandhan Reddy, Noor, Rouhan, Varshney, Nitin, Hastings, Nelson, and Asadizanjani, Navid. "Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks". IEEE Design & Test 42 (4). Country unknown/Code not available: IEEE. https://doi.org/10.1109/MDAT.2025.3541192. https://par.nsf.gov/biblio/10614527.

@article{osti_10614527,
place = {Country unknown/Code not available}, title = {Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks}, url = {https://par.nsf.gov/biblio/10614527}, DOI = {10.1109/MDAT.2025.3541192}, abstractNote = {}, journal = {IEEE Design & Test}, volume = {42}, number = {4}, publisher = {IEEE}, author = {Khan, M_Shafkat M and Biswas, Liton Kumar and Kottur, Himanandhan Reddy and Noor, Rouhan and Varshney, Nitin and Hastings, Nelson and Asadizanjani, Navid}, }