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                            GaN Metal Insulator Semiconductor High Electron Mobility Transistors using TiAlO as the gate dielectric
                        
                    - Award ID(s):
- 2239302
- PAR ID:
- 10623963
- Publisher / Repository:
- WOCSEMMAD 2024
- Date Published:
- Format(s):
- Medium: X
- Location:
- Las Vegas
- Sponsoring Org:
- National Science Foundation
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