Chae, Christopher, Zhu, Menglin, Huang, Hsien-Lien, Islam, Minhazul, and Hwang, Jinwoo. Determining Electronic and Thermal Properties of β-Ga2O3 Based Devices Using In Situ STEM Combined with Spectroscopic Methods. Retrieved from https://par.nsf.gov/biblio/10628333. Microscopy and Microanalysis 30.Supplement_1 Web. doi:10.1093/mam/ozae044.068.

Chae, Christopher, Zhu, Menglin, Huang, Hsien-Lien, Islam, Minhazul, & Hwang, Jinwoo. Determining Electronic and Thermal Properties of β-Ga2O3 Based Devices Using In Situ STEM Combined with Spectroscopic Methods. Microscopy and Microanalysis, 30 (Supplement_1). Retrieved from https://par.nsf.gov/biblio/10628333. https://doi.org/10.1093/mam/ozae044.068

Chae, Christopher, Zhu, Menglin, Huang, Hsien-Lien, Islam, Minhazul, and Hwang, Jinwoo. "Determining Electronic and Thermal Properties of β-Ga2O3 Based Devices Using In Situ STEM Combined with Spectroscopic Methods". Microscopy and Microanalysis 30 (Supplement_1). Country unknown/Code not available: Microscopy and Microanalysis. https://doi.org/10.1093/mam/ozae044.068. https://par.nsf.gov/biblio/10628333.

@article{osti_10628333,
place = {Country unknown/Code not available}, title = {Determining Electronic and Thermal Properties of β-Ga2O3 Based Devices Using In Situ STEM Combined with Spectroscopic Methods}, url = {https://par.nsf.gov/biblio/10628333}, DOI = {10.1093/mam/ozae044.068}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {30}, number = {Supplement_1}, publisher = {Microscopy and Microanalysis}, author = {Chae, Christopher and Zhu, Menglin and Huang, Hsien-Lien and Islam, Minhazul and Hwang, Jinwoo}, }