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Title: Sensitivity Analysis of Si-Avalanche Photodiode for Noise Performance Assessment
Award ID(s):
2329884 2117424
PAR ID:
10629987
Author(s) / Creator(s):
; ;
Publisher / Repository:
IEEE
Date Published:
ISBN:
979-8-3315-4143-9
Page Range / eLocation ID:
114 to 116
Subject(s) / Keyword(s):
APD noise, APD reliability, sensitivity analysis, shot noise
Format(s):
Medium: X
Location:
Salt Lake City, UT, USA
Sponsoring Org:
National Science Foundation
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