Patra, Srijita, Ajdari, Bahar, Ascazubi, Ricardo, and Kumar, Ratnesh. Electromigration Failure Characterization Using Laser-Induced Nonuniform Heating. Retrieved from https://par.nsf.gov/biblio/10630786. IEEE Transactions on Electron Devices 72.5 Web. doi:10.1109/TED.2025.3549743.

Patra, Srijita, Ajdari, Bahar, Ascazubi, Ricardo, & Kumar, Ratnesh. Electromigration Failure Characterization Using Laser-Induced Nonuniform Heating. IEEE Transactions on Electron Devices, 72 (5). Retrieved from https://par.nsf.gov/biblio/10630786. https://doi.org/10.1109/TED.2025.3549743

Patra, Srijita, Ajdari, Bahar, Ascazubi, Ricardo, and Kumar, Ratnesh. "Electromigration Failure Characterization Using Laser-Induced Nonuniform Heating". IEEE Transactions on Electron Devices 72 (5). Country unknown/Code not available: IEEE. https://doi.org/10.1109/TED.2025.3549743. https://par.nsf.gov/biblio/10630786.

@article{osti_10630786,
place = {Country unknown/Code not available}, title = {Electromigration Failure Characterization Using Laser-Induced Nonuniform Heating}, url = {https://par.nsf.gov/biblio/10630786}, DOI = {10.1109/TED.2025.3549743}, abstractNote = {}, journal = {IEEE Transactions on Electron Devices}, volume = {72}, number = {5}, publisher = {IEEE}, author = {Patra, Srijita and Ajdari, Bahar and Ascazubi, Ricardo and Kumar, Ratnesh}, }