Maloney, Cameron J, Taliaferro, Lucas G, Ventura, Jonathan D, and Wang, Long. Deep learning-based microstructure reconstruction for characterizing the electromechanical property of nanomaterial networks. Retrieved from https://par.nsf.gov/biblio/10631053. Web. doi:10.1117/12.3051137.

Maloney, Cameron J, Taliaferro, Lucas G, Ventura, Jonathan D, & Wang, Long. Deep learning-based microstructure reconstruction for characterizing the electromechanical property of nanomaterial networks. Retrieved from https://par.nsf.gov/biblio/10631053. https://doi.org/10.1117/12.3051137

Maloney, Cameron J, Taliaferro, Lucas G, Ventura, Jonathan D, and Wang, Long. "Deep learning-based microstructure reconstruction for characterizing the electromechanical property of nanomaterial networks". Country unknown/Code not available: SPIE. https://doi.org/10.1117/12.3051137. https://par.nsf.gov/biblio/10631053.

@article{osti_10631053,
place = {Country unknown/Code not available}, title = {Deep learning-based microstructure reconstruction for characterizing the electromechanical property of nanomaterial networks}, url = {https://par.nsf.gov/biblio/10631053}, DOI = {10.1117/12.3051137}, abstractNote = {}, journal = {}, publisher = {SPIE}, author = {Maloney, Cameron J and Taliaferro, Lucas G and Ventura, Jonathan D and Wang, Long}, editor = {Gutierrez_Soto, Mariantonieta and Mailen, Russell W and Pinto, Fulvio} }