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  • Sub-Nanometer Equivalent Oxide Thickness and Threshold Voltage Control Enabled by Silicon Seed Layer on Monolayer MoS 2 Transistors

This content will become publicly available on February 19, 2026

Title: Sub-Nanometer Equivalent Oxide Thickness and Threshold Voltage Control Enabled by Silicon Seed Layer on Monolayer MoS 2 Transistors
Award ID(s):
2425218
PAR ID:
10632644
Author(s) / Creator(s):
; ; ; ; ; ; ; ; ; ;
Publisher / Repository:
ACS
Date Published:
Journal Name:
Nano Letters
Volume:
25
Issue:
7
ISSN:
1530-6984
Page Range / eLocation ID:
2587 to 2593
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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