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  • A Survey of Electromagnetic Radiation Based Hardware Assurance and Reliability Monitoring Methods in Integrated Circuits
Title: A Survey of Electromagnetic Radiation Based Hardware Assurance and Reliability Monitoring Methods in Integrated Circuits
Award ID(s):
1916722
PAR ID:
10634700
Author(s) / Creator(s):
; ;
Publisher / Repository:
IEEE Access
Date Published:
Journal Name:
IEEE Access
Volume:
12
ISSN:
2169-3536
Page Range / eLocation ID:
150623 to 150638
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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