Dixon, Porter, Ramollari, Helio, Carter, Aiden, Harkness, James, Amin, Md Nafiz, Pan, Denghui, Yuzvinsky, Tom, Schmidt, Holger, and Hawkins, Aaron R. Sub-Nanowatt Sensitivity MMI Spectrometers With Elevated Scattering Regions. Retrieved from https://par.nsf.gov/biblio/10634806. Journal of Lightwave Technology 43.16 Web. doi:10.1109/JLT.2025.3580717.

Dixon, Porter, Ramollari, Helio, Carter, Aiden, Harkness, James, Amin, Md Nafiz, Pan, Denghui, Yuzvinsky, Tom, Schmidt, Holger, & Hawkins, Aaron R. Sub-Nanowatt Sensitivity MMI Spectrometers With Elevated Scattering Regions. Journal of Lightwave Technology, 43 (16). Retrieved from https://par.nsf.gov/biblio/10634806. https://doi.org/10.1109/JLT.2025.3580717

Dixon, Porter, Ramollari, Helio, Carter, Aiden, Harkness, James, Amin, Md Nafiz, Pan, Denghui, Yuzvinsky, Tom, Schmidt, Holger, and Hawkins, Aaron R. "Sub-Nanowatt Sensitivity MMI Spectrometers With Elevated Scattering Regions". Journal of Lightwave Technology 43 (16). Country unknown/Code not available: IEEE. https://doi.org/10.1109/JLT.2025.3580717. https://par.nsf.gov/biblio/10634806.

@article{osti_10634806,
place = {Country unknown/Code not available}, title = {Sub-Nanowatt Sensitivity MMI Spectrometers With Elevated Scattering Regions}, url = {https://par.nsf.gov/biblio/10634806}, DOI = {10.1109/JLT.2025.3580717}, abstractNote = {}, journal = {Journal of Lightwave Technology}, volume = {43}, number = {16}, publisher = {IEEE}, author = {Dixon, Porter and Ramollari, Helio and Carter, Aiden and Harkness, James and Amin, Md Nafiz and Pan, Denghui and Yuzvinsky, Tom and Schmidt, Holger and Hawkins, Aaron R}, }