Chaudhuri, Jayeeta, Thapar, Dhruv, Chaudhuri, Arjun, Firouzi, Farshad, and Chakrabarty, Krishnendu. SPICED+: Syntactical Bug Pattern Identification and Correction of Trojans in A/MS Circuits Using LLM-Enhanced Detection. Retrieved from https://par.nsf.gov/biblio/10638682. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 33.4 Web. doi:10.1109/TVLSI.2025.3527382.

Chaudhuri, Jayeeta, Thapar, Dhruv, Chaudhuri, Arjun, Firouzi, Farshad, & Chakrabarty, Krishnendu. SPICED+: Syntactical Bug Pattern Identification and Correction of Trojans in A/MS Circuits Using LLM-Enhanced Detection. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 33 (4). Retrieved from https://par.nsf.gov/biblio/10638682. https://doi.org/10.1109/TVLSI.2025.3527382

Chaudhuri, Jayeeta, Thapar, Dhruv, Chaudhuri, Arjun, Firouzi, Farshad, and Chakrabarty, Krishnendu. "SPICED+: Syntactical Bug Pattern Identification and Correction of Trojans in A/MS Circuits Using LLM-Enhanced Detection". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 33 (4). Country unknown/Code not available: IEEE. https://doi.org/10.1109/TVLSI.2025.3527382. https://par.nsf.gov/biblio/10638682.

@article{osti_10638682,
place = {Country unknown/Code not available}, title = {SPICED+: Syntactical Bug Pattern Identification and Correction of Trojans in A/MS Circuits Using LLM-Enhanced Detection}, url = {https://par.nsf.gov/biblio/10638682}, DOI = {10.1109/TVLSI.2025.3527382}, abstractNote = {Not Available}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, volume = {33}, number = {4}, publisher = {IEEE}, author = {Chaudhuri, Jayeeta and Thapar, Dhruv and Chaudhuri, Arjun and Firouzi, Farshad and Chakrabarty, Krishnendu}, }