Shi, Chuqiao, Li, Yanxing, Espitia, Giovanny, Dutta, Rwik, Yang, Yao, Jiang, Yi, Naik, Mit, Shih, Chih-Kang, and Han, Yimo. Electron Ptychography Resolves Individual Atomic Layers in Twisted Super-Moiré. Retrieved from https://par.nsf.gov/biblio/10640857. Microscopy and Microanalysis 31.Supplement_1 Web. doi:10.1093/mam/ozaf048.048.

Shi, Chuqiao, Li, Yanxing, Espitia, Giovanny, Dutta, Rwik, Yang, Yao, Jiang, Yi, Naik, Mit, Shih, Chih-Kang, & Han, Yimo. Electron Ptychography Resolves Individual Atomic Layers in Twisted Super-Moiré. Microscopy and Microanalysis, 31 (Supplement_1). Retrieved from https://par.nsf.gov/biblio/10640857. https://doi.org/10.1093/mam/ozaf048.048

Shi, Chuqiao, Li, Yanxing, Espitia, Giovanny, Dutta, Rwik, Yang, Yao, Jiang, Yi, Naik, Mit, Shih, Chih-Kang, and Han, Yimo. "Electron Ptychography Resolves Individual Atomic Layers in Twisted Super-Moiré". Microscopy and Microanalysis 31 (Supplement_1). Country unknown/Code not available: Microscopy Society of America. https://doi.org/10.1093/mam/ozaf048.048. https://par.nsf.gov/biblio/10640857.

@article{osti_10640857,
place = {Country unknown/Code not available}, title = {Electron Ptychography Resolves Individual Atomic Layers in Twisted Super-Moiré}, url = {https://par.nsf.gov/biblio/10640857}, DOI = {10.1093/mam/ozaf048.048}, abstractNote = {Not Available}, journal = {Microscopy and Microanalysis}, volume = {31}, number = {Supplement_1}, publisher = {Microscopy Society of America}, author = {Shi, Chuqiao and Li, Yanxing and Espitia, Giovanny and Dutta, Rwik and Yang, Yao and Jiang, Yi and Naik, Mit and Shih, Chih-Kang and Han, Yimo}, }