Kuntz, Steven J, and Rawlings, James B. Maximum Likelihood Identification of Linear Models With Integrating Disturbances for Offset-Free Control. Retrieved from https://par.nsf.gov/biblio/10642501. IEEE Transactions on Automatic Control 70.9 Web. doi:10.1109/TAC.2025.3547607.

Kuntz, Steven J, & Rawlings, James B. Maximum Likelihood Identification of Linear Models With Integrating Disturbances for Offset-Free Control. IEEE Transactions on Automatic Control, 70 (9). Retrieved from https://par.nsf.gov/biblio/10642501. https://doi.org/10.1109/TAC.2025.3547607

Kuntz, Steven J, and Rawlings, James B. "Maximum Likelihood Identification of Linear Models With Integrating Disturbances for Offset-Free Control". IEEE Transactions on Automatic Control 70 (9). Country unknown/Code not available: IEEE Transactions on Automatic Control. https://doi.org/10.1109/TAC.2025.3547607. https://par.nsf.gov/biblio/10642501.

@article{osti_10642501,
place = {Country unknown/Code not available}, title = {Maximum Likelihood Identification of Linear Models With Integrating Disturbances for Offset-Free Control}, url = {https://par.nsf.gov/biblio/10642501}, DOI = {10.1109/TAC.2025.3547607}, abstractNote = {Not Available}, journal = {IEEE Transactions on Automatic Control}, volume = {70}, number = {9}, publisher = {IEEE Transactions on Automatic Control}, author = {Kuntz, Steven J and Rawlings, James B}, }