Black, Gavin, Yocam, Eric, Mathew_Vaidyan, Varghese, Comert, Gurcan, and Wang, Yong. From LLMs to Randomness: Analyzing Program Input Efficacy With Resource and Language Metrics. Retrieved from https://par.nsf.gov/biblio/10642963. IEEE Access 13. Web. doi:10.1109/ACCESS.2025.3571205.

Black, Gavin, Yocam, Eric, Mathew_Vaidyan, Varghese, Comert, Gurcan, & Wang, Yong. From LLMs to Randomness: Analyzing Program Input Efficacy With Resource and Language Metrics. IEEE Access, 13 (). Retrieved from https://par.nsf.gov/biblio/10642963. https://doi.org/10.1109/ACCESS.2025.3571205

Black, Gavin, Yocam, Eric, Mathew_Vaidyan, Varghese, Comert, Gurcan, and Wang, Yong. "From LLMs to Randomness: Analyzing Program Input Efficacy With Resource and Language Metrics". IEEE Access 13 (). Country unknown/Code not available: IEEE. https://doi.org/10.1109/ACCESS.2025.3571205. https://par.nsf.gov/biblio/10642963.

@article{osti_10642963,
place = {Country unknown/Code not available}, title = {From LLMs to Randomness: Analyzing Program Input Efficacy With Resource and Language Metrics}, url = {https://par.nsf.gov/biblio/10642963}, DOI = {10.1109/ACCESS.2025.3571205}, abstractNote = {Not Available}, journal = {IEEE Access}, volume = {13}, publisher = {IEEE}, author = {Black, Gavin and Yocam, Eric and Mathew_Vaidyan, Varghese and Comert, Gurcan and Wang, Yong}, }