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This content will become publicly available on July 7, 2026

Title: Semiconductor Wafer Map Defect Classification Using Convolutional Neural Networks on Imbalanced Classes
Award ID(s):
2401880
PAR ID:
10658437
Author(s) / Creator(s):
 ;  
Publisher / Repository:
IEEE
Date Published:
Page Range / eLocation ID:
54 to 62
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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