Li, Tianze, Li, Lei, and Hwang, James CM. Ultra-Wideband Multi-Line Calibration by Microstrip and Coplanar Impedance Standards on the Same GaAs Chip. Retrieved from https://par.nsf.gov/biblio/10664207. Web. doi:10.1109/ARFTG63706.2025.10989804.
Li, Tianze, Li, Lei, & Hwang, James CM. Ultra-Wideband Multi-Line Calibration by Microstrip and Coplanar Impedance Standards on the Same GaAs Chip. Retrieved from https://par.nsf.gov/biblio/10664207. https://doi.org/10.1109/ARFTG63706.2025.10989804
@article{osti_10664207,
place = {Country unknown/Code not available},
title = {Ultra-Wideband Multi-Line Calibration by Microstrip and Coplanar Impedance Standards on the Same GaAs Chip},
url = {https://par.nsf.gov/biblio/10664207},
DOI = {10.1109/ARFTG63706.2025.10989804},
abstractNote = {Not Available},
journal = {},
publisher = {IEEE},
author = {Li, Tianze and Li, Lei and Hwang, James CM},
}
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