Rethinking LLM Safety on Edge Devices: Unearthing Hidden Vulnerabilities through Power Stress

Fu, Weimin; Lu, Zelin; Qu, Gang; Guo, Xiaolong

doi:10.1109/AsianHOST68425.2025.11370374

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Citation Details

This content will become publicly available on December 19, 2026

Rethinking LLM Safety on Edge Devices: Unearthing Hidden Vulnerabilities through Power Stress

Award ID(s):: 2340949 2419880

PAR ID:: 10679775

Author(s) / Creator(s):: Fu, Weimin ; Lu, Zelin ; Qu, Gang ; Guo, Xiaolong

Publisher / Repository:: IEEE

Date Published:: 2025-12-19

ISBN:: 979-8-3315-8924-0

Page Range / eLocation ID:: 1 to 6

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
This content will become publicly available on December 19, 2026
Conference Paper:
https://doi.org/10.1109/AsianHOST68425.2025.11370374

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