Capocasa, F, Rumaiz, A K, Weiland, C, Goul, R, Marshall, A, Harding, I, Ozbay, A, Kuczewski, A J, Karmakar, S, Boukhicha, M, Miryala, S, Carini, G A, Siddons, D P, Woicik, J C, and Wu, J Z. Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy. Retrieved from https://par.nsf.gov/biblio/10682558. Scientific Reports 16.1 Web. doi:10.1038/s41598-025-30246-4.

Capocasa, F, Rumaiz, A K, Weiland, C, Goul, R, Marshall, A, Harding, I, Ozbay, A, Kuczewski, A J, Karmakar, S, Boukhicha, M, Miryala, S, Carini, G A, Siddons, D P, Woicik, J C, & Wu, J Z. Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy. Scientific Reports, 16 (1). Retrieved from https://par.nsf.gov/biblio/10682558. https://doi.org/10.1038/s41598-025-30246-4

Capocasa, F, Rumaiz, A K, Weiland, C, Goul, R, Marshall, A, Harding, I, Ozbay, A, Kuczewski, A J, Karmakar, S, Boukhicha, M, Miryala, S, Carini, G A, Siddons, D P, Woicik, J C, and Wu, J Z. "Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy". Scientific Reports 16 (1). Country unknown/Code not available: Springer Nature. https://doi.org/10.1038/s41598-025-30246-4. https://par.nsf.gov/biblio/10682558.

@article{osti_10682558,
place = {Country unknown/Code not available}, title = {Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy}, url = {https://par.nsf.gov/biblio/10682558}, DOI = {10.1038/s41598-025-30246-4}, abstractNote = {Not Available}, journal = {Scientific Reports}, volume = {16}, number = {1}, publisher = {Springer Nature}, author = {Capocasa, F and Rumaiz, A K and Weiland, C and Goul, R and Marshall, A and Harding, I and Ozbay, A and Kuczewski, A J and Karmakar, S and Boukhicha, M and Miryala, S and Carini, G A and Siddons, D P and Woicik, J C and Wu, J Z}, }