This paper presents the design and performance evaluation of a class of Phase-Frequency Detectors (PFDs) implemented utilizing only logic gates. It is a suitable candidate for applications like All-Digital Phase-Locked Loops (ADPLLs) and Delay-Locked Loops (DLLs). The proposed design is laid out in 65 nm CMOS and 22 nm FD-SOI technology and it is validated using post-extracted simulations. According to the results the proposed PFD is blind zone free and exhibits a small dead zone of ≈ 7 ps and ≈ 9 ps with a detection range of ±2π at a frequency of 10 GHz and 8 GHz in 22 nm and 65 nm, respectively. The proposed design has jitter ≈ 448 fs in 22 nm and ≈ 1.2 ps in 65 nm. The proposed PFD occupies a layout area of 115.625 μm2 and consumes 7.2 μW in 22nm and the area of the design is 225.7 μm2 and consumes 11.03 μW in 65nm.
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Impact of Non-Functional Pads Location on Eye Diagram Performance
This study shows that placing four NFPs in selective PCB layers significantly improves signal integrity, reducing minimum jitter from 18.28 ps to 12.81 ps and maximum jitter from 27.66 ps to 22.03 ps.
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- Award ID(s):
- 1916535
- PAR ID:
- 10696581
- Publisher / Repository:
- IEEE
- Date Published:
- ISBN:
- 979-8-3503-5123-1
- Page Range / eLocation ID:
- 1 to 3
- Subject(s) / Keyword(s):
- Degradation Jitter Performance gain Complexity theory Impedance Signal integrity Electronics packaging Eye Diagrams Integration Of Signals Printed Circuit Board Selective Layer Impedance Optimal Placement Strategic Placement Eye Height Advanced Design System Trace Length Signal Integrity Non-functional Pads (NFP) Eye Diagram
- Format(s):
- Medium: X
- Location:
- Toronto, ON, Canada
- Sponsoring Org:
- National Science Foundation
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