Wu, M, Choffin, Z, KONG, L, LEE, H, Sun, S, and Jeong, Nathan. Noninvasive Microwave Imaging and Machine Learning to Assess Ripeness of Avocados. Retrieved from https://par.nsf.gov/biblio/10699873. IEEE Journal of Microwaves 6.1 Web. doi:10.1109/JMW.2025.3636171.

Wu, M, Choffin, Z, KONG, L, LEE, H, Sun, S, & Jeong, Nathan. Noninvasive Microwave Imaging and Machine Learning to Assess Ripeness of Avocados. IEEE Journal of Microwaves, 6 (1). Retrieved from https://par.nsf.gov/biblio/10699873. https://doi.org/10.1109/JMW.2025.3636171

Wu, M, Choffin, Z, KONG, L, LEE, H, Sun, S, and Jeong, Nathan. "Noninvasive Microwave Imaging and Machine Learning to Assess Ripeness of Avocados". IEEE Journal of Microwaves 6 (1). Country unknown/Code not available: IEEE. https://doi.org/10.1109/JMW.2025.3636171. https://par.nsf.gov/biblio/10699873.

@article{osti_10699873,
place = {Country unknown/Code not available}, title = {Noninvasive Microwave Imaging and Machine Learning to Assess Ripeness of Avocados}, url = {https://par.nsf.gov/biblio/10699873}, DOI = {10.1109/JMW.2025.3636171}, abstractNote = {Not Available}, journal = {IEEE Journal of Microwaves}, volume = {6}, number = {1}, publisher = {IEEE}, author = {Wu, M and Choffin, Z and KONG, L and LEE, H and Sun, S and Jeong, Nathan}, }