%AKamburov, D. [Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA]%ABaldwin, K. [Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA]%AWest, K. [Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA]%ALyon, S. [Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA]%APfeiffer, L. [Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA]%APinczuk, A. [Department of Physics, Columbia University, New York, New York 10027, USA]%BJournal Name: Applied Physics Letters; Journal Volume: 110; Journal Issue: 26 %D2017%IAmerican Institute of Physics %JJournal Name: Applied Physics Letters; Journal Volume: 110; Journal Issue: 26 %K %MOSTI ID: 10030819 %PMedium: X %TUse of micro-photoluminescence as a contactless measure of the 2D electron density in a GaAs quantum well %XNot Available %0Journal Article